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%0 Conference Paper
%1 conf/date/KhanAHKKRC14
%A Khan, Seyab
%A Agbo, Innocent
%A Hamdioui, Said
%A Kukner, Halil
%A Kaczer, Ben
%A Raghavan, Praveen
%A Catthoor, Francky
%B DATE
%D 2014
%E Fettweis, Gerhard P.
%E Nebel, Wolfgang
%I European Design and Automation Association
%K dblp
%P 1-6
%T Bias Temperature Instability analysis of FinFET based SRAM cells.
%U http://dblp.uni-trier.de/db/conf/date/date2014.html#KhanAHKKRC14
%@ 978-3-9815370-2-4
@inproceedings{conf/date/KhanAHKKRC14,
added-at = {2017-05-23T00:00:00.000+0200},
author = {Khan, Seyab and Agbo, Innocent and Hamdioui, Said and Kukner, Halil and Kaczer, Ben and Raghavan, Praveen and Catthoor, Francky},
biburl = {https://www.bibsonomy.org/bibtex/248ce46051f9ce64747eb86d9a99c954a/dblp},
booktitle = {DATE},
crossref = {conf/date/2014},
editor = {Fettweis, Gerhard P. and Nebel, Wolfgang},
ee = {http://dl.acm.org/citation.cfm?id=2616644},
interhash = {611c0d42359bf149ba8e55ac5de3ffdb},
intrahash = {48ce46051f9ce64747eb86d9a99c954a},
isbn = {978-3-9815370-2-4},
keywords = {dblp},
pages = {1-6},
publisher = {European Design and Automation Association},
timestamp = {2017-12-07T22:59:13.000+0100},
title = {Bias Temperature Instability analysis of FinFET based SRAM cells.},
url = {http://dblp.uni-trier.de/db/conf/date/date2014.html#KhanAHKKRC14},
year = 2014
}