( en | de | ru )

 

Disambiguation of "Kaczer, Ben"

Author of the publication

copydeleteadd this publication to your clipboard
Bias Temperature Instability analysis of FinFET based SRAM cells.

, , , , , , and . DATE, page 1-6. European Design and Automation Association, (2014)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Ben Schmehe

Ben Novak

Ben Schöttker

Ben Schacher

Ben Schloesser

 

Other publications of authors with the same name

The defect-centric perspective of device and circuit reliability - From individual defects to circuits., , , , , , , , , and 5 other author(s). ESSDERC, page 218-225. IEEE, (2015)Time dependent variability in RMG-HKMG FinFETs: Impact of extraction scheme on stochastic NBTI., , , , , and . IRPS, page 3. IEEE, (2015)Buried Silicon-Germanium pMOSFETs: Experimental Analysis in VLSI Logic Circuits Under Aggressive Voltage Scaling., , , , , , , , and . IEEE Trans. Very Large Scale Integr. Syst., 20 (8): 1487-1495 (2012)Understanding the Potential and the Limits of Germanium pMOSFETs for VLSI Circuits From Experimental Measurements., , , , and . IEEE Trans. Very Large Scale Integr. Syst., 19 (9): 1569-1582 (2011)A Pragmatic Model to Predict Future Device Aging., , , , , , , , , and 1 other author(s). IEEE Access, (2023)FinFET and MOSFET preliminary comparison of gate oxide reliability., , , , , and . Microelectron. Reliab., 46 (9-11): 1608-1611 (2006)A brief overview of gate oxide defect properties and their relation to MOSFET instabilities and device and circuit time-dependent variability., , , , , , , , , and 4 other author(s). Microelectron. Reliab., (2018)Investigating Nanowire, Nanosheet and Forksheet FET Hot-Carrier Reliability via TCAD Simulations: Invited Paper., , , , , , , , and . IRPS, page 1-10. IEEE, (2023)Improving the Tamper-Aware Odometer Concept by Enhancing Dynamic Stress Operation., , , , , and . IRPS, page 1-9. IEEE, (2023)Reliability and Variability-Aware DTCO Flow: Demonstration of Projections to N3 FinFET and Nanosheet Technologies., , , , , , , , , and 10 other author(s). IRPS, page 1-6. IEEE, (2021)