%0 Journal Article %1 journals/mr/SuSDLL15 %A Su, Lei %A Shi, Tielin %A Du, Li %A Lu, Xiangning %A Liao, Guanglan %D 2015 %J Microelectron. Reliab. %K dblp %N 1 %P 213-220 %T Genetic algorithms for defect detection of flip chips. %U http://dblp.uni-trier.de/db/journals/mr/mr55.html#SuSDLL15 %V 55

@article{journals/mr/SuSDLL15, added-at = {2020-02-22T00:00:00.000+0100}, author = {Su, Lei and Shi, Tielin and Du, Li and Lu, Xiangning and Liao, Guanglan}, biburl = {https://www.bibsonomy.org/bibtex/2b5df54755bf542745594f66b1a1896d5/dblp}, ee = {https://doi.org/10.1016/j.microrel.2014.09.006}, interhash = {1627da40ff6578223695f51018e20299}, intrahash = {b5df54755bf542745594f66b1a1896d5}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 1, pages = {213-220}, timestamp = {2020-02-25T13:29:40.000+0100}, title = {Genetic algorithms for defect detection of flip chips.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr55.html#SuSDLL15}, volume = 55, year = 2015 }