%0 Conference Paper %1 conf/ats/LiLLH09 %A Li, Katherine Shu-Min %A Liao, Yi-Yu %A Liu, Yuo-Wen %A Huang, Jr-Yang %B Asian Test Symposium %D 2009 %I IEEE Computer Society %K dblp %P 269-274 %T IEEE 1500 Compatible Interconnect Test with Maximal Test Concurrency. %U http://dblp.uni-trier.de/db/conf/ats/ats2009.html#LiLLH09 %@ 978-0-7695-3864-8

@inproceedings{conf/ats/LiLLH09, added-at = {2023-03-24T00:00:00.000+0100}, author = {Li, Katherine Shu-Min and Liao, Yi-Yu and Liu, Yuo-Wen and Huang, Jr-Yang}, biburl = {https://www.bibsonomy.org/bibtex/22a3ef0af549a6a42fb05131969a1da64/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2009}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2009.67}, interhash = {68699dc027fa6958b36ff187750bb633}, intrahash = {2a3ef0af549a6a42fb05131969a1da64}, isbn = {978-0-7695-3864-8}, keywords = {dblp}, pages = {269-274}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:37:09.000+0200}, title = {IEEE 1500 Compatible Interconnect Test with Maximal Test Concurrency.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2009.html#LiLLH09}, year = 2009 }