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IEEE 1500 Compatible Interconnect Test with Maximal Test Concurrency.

, , , and . Asian Test Symposium, page 269-274. IEEE Computer Society, (2009)

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Fault tolerant application-specific NoC topology synthesis for three-dimensional integrated circuits., , , , , and . SoCC, page 296-301. IEEE, (2011)IEEE Standard 1500 Compatible Oscillation Ring Test Methodology for Interconnect Delay and Crosstalk Detection., , , and . J. Electron. Test., 23 (4): 341-355 (2007)Test Data and Test Time Reduction for LOS Transition Test in Multi-Mode Segmented Scan Architecture., , , and . ATS, page 95-100. IEEE, (2007)Leakage Monitoring Technique in Near-Threshold Systems with a Time-Based Bootstrapped Ring Oscillator., , and . Asian Test Symposium, page 91-96. IEEE Computer Society, (2013)IEEE standard 1500 compatible interconnect diagnosis for delay and crosstalk faults., , , , and . ASP-DAC, page 366-371. IEEE, (2006)Oscillation ring based interconnect test scheme for SOC., , , and . ASP-DAC, page 184-187. ACM Press, (2005)TestDNA: Novel Wafer Defect Signature for Diagnosis and Yield Learning., , , , , , , and . ITC, page 1-6. IEEE, (2019)De Bruijn graph-based communication modeling for fault tolerance in smart grids., , and . APCCAS, page 623-626. IEEE, (2012)Test generation for combinational hardware Trojans., , , and . AsianHOST, page 1-6. IEEE Computer Society, (2016)PWS: Potential Wafermap Scratch Defect Pattern Recognition with Machine Learning Techniques., , , , , , and . ETS, page 1-6. IEEE, (2020)