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%0 Conference Paper
%1 conf/irps/BeekMRDSMKMG15
%A Beek, Simon Van
%A Martens, Koen
%A Roussel, Philippe
%A Donadio, Gabriele Luca
%A Swerts, Johan
%A Mertens, Sofie
%A Kar, Gouri Sankar
%A Min, Tai
%A Groeseneken, Guido
%B IRPS
%D 2015
%I IEEE
%K dblp
%P 4
%T Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions.
%U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#BeekMRDSMKMG15
%@ 978-1-4673-7362-3
@inproceedings{conf/irps/BeekMRDSMKMG15,
added-at = {2021-10-01T00:00:00.000+0200},
author = {Beek, Simon Van and Martens, Koen and Roussel, Philippe and Donadio, Gabriele Luca and Swerts, Johan and Mertens, Sofie and Kar, Gouri Sankar and Min, Tai and Groeseneken, Guido},
biburl = {https://www.bibsonomy.org/bibtex/25cc6eb581b5475645992f4fcf1876172/dblp},
booktitle = {IRPS},
crossref = {conf/irps/2015},
ee = {https://doi.org/10.1109/IRPS.2015.7112818},
interhash = {75c9963ad69f1b17a99c29a9480203f0},
intrahash = {5cc6eb581b5475645992f4fcf1876172},
isbn = {978-1-4673-7362-3},
keywords = {dblp},
pages = 4,
publisher = {IEEE},
timestamp = {2024-04-10T16:54:51.000+0200},
title = {Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions.},
url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#BeekMRDSMKMG15},
year = 2015
}