%0 Conference Paper %1 conf/irps/BeekMRDSMKMG15 %A Beek, Simon Van %A Martens, Koen %A Roussel, Philippe %A Donadio, Gabriele Luca %A Swerts, Johan %A Mertens, Sofie %A Kar, Gouri Sankar %A Min, Tai %A Groeseneken, Guido %B IRPS %D 2015 %I IEEE %K dblp %P 4 %T Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions. %U http://dblp.uni-trier.de/db/conf/irps/irps2015.html#BeekMRDSMKMG15 %@ 978-1-4673-7362-3

@inproceedings{conf/irps/BeekMRDSMKMG15, added-at = {2021-10-01T00:00:00.000+0200}, author = {Beek, Simon Van and Martens, Koen and Roussel, Philippe and Donadio, Gabriele Luca and Swerts, Johan and Mertens, Sofie and Kar, Gouri Sankar and Min, Tai and Groeseneken, Guido}, biburl = {https://www.bibsonomy.org/bibtex/25cc6eb581b5475645992f4fcf1876172/dblp}, booktitle = {IRPS}, crossref = {conf/irps/2015}, ee = {https://doi.org/10.1109/IRPS.2015.7112818}, interhash = {75c9963ad69f1b17a99c29a9480203f0}, intrahash = {5cc6eb581b5475645992f4fcf1876172}, isbn = {978-1-4673-7362-3}, keywords = {dblp}, pages = 4, publisher = {IEEE}, timestamp = {2024-04-10T16:54:51.000+0200}, title = {Four point probe ramped voltage stress as an efficient method to understand breakdown of STT-MRAM MgO tunnel junctions.}, url = {http://dblp.uni-trier.de/db/conf/irps/irps2015.html#BeekMRDSMKMG15}, year = 2015 }