%0 Journal Article %1 journals/mr/GerardinGCPG06 %A Gerardin, Simone %A Griffoni, Alessio %A Cester, Andrea %A Paccagnella, Alessandro %A Ghidini, G. %D 2006 %J Microelectron. Reliab. %K dblp %N 9-11 %P 1669-1672 %T Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress. %U http://dblp.uni-trier.de/db/journals/mr/mr46.html#GerardinGCPG06 %V 46

@article{journals/mr/GerardinGCPG06, added-at = {2022-10-02T00:00:00.000+0200}, author = {Gerardin, Simone and Griffoni, Alessio and Cester, Andrea and Paccagnella, Alessandro and Ghidini, G.}, biburl = {https://www.bibsonomy.org/bibtex/26d8e99c07efed9d09f690c2efb844db3/dblp}, ee = {https://doi.org/10.1016/j.microrel.2006.07.052}, interhash = {1791c7fc6205f80a8f512a3a5a731c2a}, intrahash = {6d8e99c07efed9d09f690c2efb844db3}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {9-11}, pages = {1669-1672}, timestamp = {2024-04-09T02:50:13.000+0200}, title = {Degradation of static and dynamic behavior of CMOS inverters during constant and pulsed voltage stress.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr46.html#GerardinGCPG06}, volume = 46, year = 2006 }