%0 Conference Paper %1 conf/vts/GirardLMP97 %A Girard, Patrick %A Landrault, Christian %A Moreda, V. %A Pravossoudovitch, Serge %B VTS %D 1997 %I IEEE Computer Society %K dblp %P 94-100 %T An optimized BIST test pattern generator for delay testing. %U http://dblp.uni-trier.de/db/conf/vts/vts1997.html#GirardLMP97 %@ 0-8186-7810-0

@inproceedings{conf/vts/GirardLMP97, added-at = {2023-03-24T00:00:00.000+0100}, author = {Girard, Patrick and Landrault, Christian and Moreda, V. and Pravossoudovitch, Serge}, biburl = {https://www.bibsonomy.org/bibtex/2cd5b1b98907ad099a2676570e6399748/dblp}, booktitle = {VTS}, crossref = {conf/vts/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/VTEST.1997.599448}, interhash = {799aca37a3bd2fdb44bb24b3aab1f4c5}, intrahash = {cd5b1b98907ad099a2676570e6399748}, isbn = {0-8186-7810-0}, keywords = {dblp}, pages = {94-100}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T07:35:22.000+0200}, title = {An optimized BIST test pattern generator for delay testing.}, url = {http://dblp.uni-trier.de/db/conf/vts/vts1997.html#GirardLMP97}, year = 1997 }