Author of the publication

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

An optimized BIST test pattern generator for delay testing.

P. Girard, C. Landrault, V. Moreda, and S. Pravossoudovitch. VTS, page 94-100. IEEE Computer Society, (1997)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Prioritised ceteris paribus logic for counterfactual reasoning.P. Girard, and M. Triplett. Synthese, 195 (4): 1681-1703 (2018)Validation d'une approche " basée sur exemples " pour l'apprentissage de la programmation.N. Guibert, L. Guittet, and P. Girard. IHM, volume 264 of ACM International Conference Proceeding Series, page 147-154. ACM, (2005)Example-based programming: a pertinent visual approach for learning to program.N. Guibert, P. Girard, and L. Guittet. AVI, page 358-361. ACM Press, (2004)Towards approximation during test of Integrated Circuits.I. Wali, M. Traiola, A. Virazel, P. Girard, M. Barbareschi, and A. Bosio. DDECS, page 28-33. IEEE, (2017)An Efficient BIST Architecture for Delay Faults in the Logic Cells of Symmetrical SRAM-Based FPGAs.P. Girard, O. Héron, S. Pravossoudovitch, and M. Renovell. J. Electron. Test., 22 (2): 161-172 (2006)An advanced diagnostic method for delay faults in combinational faulty circuits.P. Girard, C. Landrault, and S. Pravossoudovitch. J. Electron. Test., 6 (3): 277-294 (1995)A Layout-Aware Pattern Grading Procedure for Critical Paths Considering Power Supply Noise and Crosstalk.J. Ma, M. Tehranipoor, and P. Girard. J. Electron. Test., 28 (2): 201-214 (2012)Everything Else Being Equal: A Modal Logic for Ceteris Paribus Preferences.J. van Benthem, P. Girard, and O. Roy. J. Philosophical Logic, 38 (1): 83-125 (2009)Design of a Sextuple Cross-Coupled SRAM Cell with Optimized Access Operations for Highly Reliable Terrestrial Applications.A. Yan, Z. Wu, J. Zhou, Y. Hu, Y. Chen, Z. Ying, X. Wen, and P. Girard. ATS, page 55-60. IEEE, (2019)Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity.P. Girard, L. Guiller, C. Landrault, S. Pravossoudovitch, J. Figueras, S. Manich, J. Teixeira, and M. Santos. ISCAS (1), page 110-113. IEEE, (1999)

BibSonomy

Disambiguation of "Girard, Patrick"

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

An optimized BIST test pattern generator for delay testing.

Please choose a person to relate this publication to

Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Girard, Patrick"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML An optimized BIST test pattern generator for delay testing.

Please choose a person to relate this publication to

Benoît Girard

Adrien Girard

Jules Girard

Pierre Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

An optimized BIST test pattern generator for delay testing.