%0 Journal Article %1 journals/mr/DeloffreMGBBBGC05 %A Deloffre, Emilie %A Montès, L. %A Ghibaudo, Gérard %A Bruyère, Sylvie %A Blonkowski, Serge %A Bécu, Stéphane %A Gros-Jean, Mickael %A Crémer, Sébastien %D 2005 %J Microelectron. Reliab. %K dblp %N 5-6 %P 925-928 %T Electrical properties in low temperature range (5K-300K) of Tantalum Oxide dielectric MIM capacitors. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#DeloffreMGBBBGC05 %V 45

@article{journals/mr/DeloffreMGBBBGC05, added-at = {2020-02-22T00:00:00.000+0100}, author = {Deloffre, Emilie and Montès, L. and Ghibaudo, Gérard and Bruyère, Sylvie and Blonkowski, Serge and Bécu, Stéphane and Gros-Jean, Mickael and Crémer, Sébastien}, biburl = {https://www.bibsonomy.org/bibtex/25eb17e3b20bb13878666adcc5b339d82/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.11.024}, interhash = {823300639da87acab24d6526c2128e35}, intrahash = {5eb17e3b20bb13878666adcc5b339d82}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {5-6}, pages = {925-928}, timestamp = {2020-02-25T13:30:23.000+0100}, title = {Electrical properties in low temperature range (5K-300K) of Tantalum Oxide dielectric MIM capacitors.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#DeloffreMGBBBGC05}, volume = 45, year = 2005 }