%0 Journal Article %1 journals/ipsj/HigamiWTKS16 %A Higami, Yoshinobu %A Wang, Senling %A Takahashi, Hiroshi %A ya Kobayashi, Shin %A Saluja, Kewal K. %D 2016 %J IPSJ Trans. Syst. LSI Des. Methodol. %K dblp %P 13-20 %T Diagnosis Methods for Gate Delay Faults with Various Amounts of Delays. %U http://dblp.uni-trier.de/db/journals/ipsj/ipsj9.html#HigamiWTKS16 %V 9

@article{journals/ipsj/HigamiWTKS16, added-at = {2020-09-29T00:00:00.000+0200}, author = {Higami, Yoshinobu and Wang, Senling and Takahashi, Hiroshi and ya Kobayashi, Shin and Saluja, Kewal K.}, biburl = {https://www.bibsonomy.org/bibtex/2b13edef8cc1dc96a985d64fe0006f0d7/dblp}, ee = {https://doi.org/10.2197/ipsjtsldm.9.13}, interhash = {85347934de0920558736f48fc2bc1e5d}, intrahash = {b13edef8cc1dc96a985d64fe0006f0d7}, journal = {IPSJ Trans. Syst. LSI Des. Methodol.}, keywords = {dblp}, pages = {13-20}, timestamp = {2020-09-30T11:34:19.000+0200}, title = {Diagnosis Methods for Gate Delay Faults with Various Amounts of Delays.}, url = {http://dblp.uni-trier.de/db/journals/ipsj/ipsj9.html#HigamiWTKS16}, volume = 9, year = 2016 }