%0 Journal Article %1 journals/tcad/WeberRD16 %A Weber, Stephan %A Ressurreicao, Tiago %A Duarte, Cândido %D 2016 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 6 %P 931-942 %T Yield Prediction With a New Generalized Process Capability Index Applicable to Non-Normal Data. %U http://dblp.uni-trier.de/db/journals/tcad/tcad35.html#WeberRD16 %V 35

@article{journals/tcad/WeberRD16, added-at = {2020-09-24T00:00:00.000+0200}, author = {Weber, Stephan and Ressurreicao, Tiago and Duarte, Cândido}, biburl = {https://www.bibsonomy.org/bibtex/268266aa5452a7a81e92b69e7f49f942a/dblp}, ee = {https://doi.org/10.1109/TCAD.2015.2481865}, interhash = {957aba189f7a4d17f33ba1b9270811a3}, intrahash = {68266aa5452a7a81e92b69e7f49f942a}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 6, pages = {931-942}, timestamp = {2020-09-25T11:45:47.000+0200}, title = {Yield Prediction With a New Generalized Process Capability Index Applicable to Non-Normal Data.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad35.html#WeberRD16}, volume = 35, year = 2016 }