%0 Journal Article %1 journals/mr/DouglasCCGLLHWJVKJRP11 %A Douglas, E. A. %A Chang, C. Y. %A Cheney, David J. %A Gila, B. P. %A Lo, Chi-Fai %A Lu, Liu %A Holzworth, M. R. %A Whiting, Patrick G. %A Jones, Kevin S. %A Via, Glen David %A Kim, Jinhyung %A Jang, Soohwan %A Ren, Fan %A Pearton, Stephen J. %D 2011 %J Microelectron. Reliab. %K dblp %N 2 %P 207-211 %T AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress. %U http://dblp.uni-trier.de/db/journals/mr/mr51.html#DouglasCCGLLHWJVKJRP11 %V 51

@article{journals/mr/DouglasCCGLLHWJVKJRP11, added-at = {2022-09-06T00:00:00.000+0200}, author = {Douglas, E. A. and Chang, C. Y. and Cheney, David J. and Gila, B. P. and Lo, Chi-Fai and Lu, Liu and Holzworth, M. R. and Whiting, Patrick G. and Jones, Kevin S. and Via, Glen David and Kim, Jinhyung and Jang, Soohwan and Ren, Fan and Pearton, Stephen J.}, biburl = {https://www.bibsonomy.org/bibtex/229f9eab945c7510553b7415f51cf9383/dblp}, ee = {https://doi.org/10.1016/j.microrel.2010.09.024}, interhash = {9fd3e363dd3fb81f89231df0cae6466e}, intrahash = {29f9eab945c7510553b7415f51cf9383}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = 2, pages = {207-211}, timestamp = {2024-04-09T02:50:06.000+0200}, title = {AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr51.html#DouglasCCGLLHWJVKJRP11}, volume = 51, year = 2011 }