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AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress.

E. Douglas, C. Chang, D. Cheney, B. Gila, C. Lo, L. Lu, M. Holzworth, P. Whiting, K. Jones, G. Via, J. Kim, S. Jang, F. Ren, and S. Pearton. Microelectron. Reliab., 51 (2): 207-211 (2011)

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To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

Sheng-Chia Chang

William Ockham's view on human capabilityS. Chang. Uni Frankfurt Main, (2009)

Denis Chang Seng

Doo-Bong Chang

Belinda Chang

Teh-Hsien Chang

Other publications of authors with the same name

Database to Dynamically Aid Probe Design for Virus Identification.F. Lin, H. Huang, Y. Chang, A. Tsou, P. Chan, L. Wu, M. Tsai, and J. Horng. IEEE Trans. Information Technology in Biomedicine, 10 (4): 705-713 (2006)Investigation of the effect of temperature during off-state degradation of AlGaN/GaN High Electron Mobility Transistors.E. Douglas, C. Chang, B. Gila, M. Holzworth, K. Jones, L. Liu, J. Kim, S. Jang, G. Via, F. Ren and 1 other author(s). Microelectron. Reliab., 52 (1): 23-28 (2012)A Level Set Formulation of Eulerian Interface Capturing Methods for Incompressible Fluid FlowsY. Chang, T. Hou, B. Merriman, and S. Osher. Journal of Computational Physics, (1996)0.18 µm CMOS UWB LNA with new feedback configuration for optimization low noise, high gain and small area.Y. Chang, H. Kao, C. Kao, C. Yang, J. Fu, N. Karmakar, and L. Chang. DDECS, page 194-197. IEEE Computer Society, (2009)A note on the covariance matrix of the maximum likelihood estimator in constrained multivariate linear regressionY. Chang. Journal of Econometrics, 28 (2): 247--252 (May 1985)E-learning Systems Evaluation with Data Envelopment Analysis and Bayesian Networks.H. Kao, M. Liu, C. Huang, and Y. Chang. NCM, page 1207-1210. IEEE Computer Society, (2009)Adaptive multichannel filtering.C. Chang. ICASSP, page 462-465. IEEE, (1980)Interval estimation of capability index Cpmk for manufacturing processes with asymmetric tolerances.Y. Chang. Comput. Ind. Eng., 56 (1): 312-322 (2009)Electronic and optical properties of GaAs(001) (2 x 4) and (4 x 2) surfacesS. Ren, and Y. Chang. Phys.~Rev.~B, (1991)AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress.E. Douglas, C. Chang, D. Cheney, B. Gila, C. Lo, L. Lu, M. Holzworth, P. Whiting, K. Jones, G. Via and 4 other author(s). Microelectron. Reliab., 51 (2): 207-211 (2011)

BibSonomy

Disambiguation of "Chang, C. Y."

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AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress.

Please choose a person to relate this publication to

Sheng-Chia Chang

Denis Chang Seng

Doo-Bong Chang

Belinda Chang

Teh-Hsien Chang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Chang, C. Y."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress.

Please choose a person to relate this publication to

Sheng-Chia Chang

Denis Chang Seng

Doo-Bong Chang

Belinda Chang

Teh-Hsien Chang

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

AlGaN/GaN High Electron Mobility Transistor degradation under on- and off-state stress.