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%0 Conference Paper
%1 conf/dac/YamadaWSITF77
%A Yamada, Akihiko
%A Wakatsuki, Nobuo
%A Shibano, Hideo
%A Itoh, Osamu
%A Tomita, Kyoji
%A Funatsu, Shigehiro
%B DAC
%D 1977
%E Brinsfield, Judith G.
%E Szygenda, Stephen A.
%E Hightower, David W.
%I ACM
%K dblp
%P 78-83
%T Automatic test generation for large digital circuits.
%U http://dblp.uni-trier.de/db/conf/dac/dac1977.html#YamadaWSITF77
@inproceedings{conf/dac/YamadaWSITF77,
added-at = {2012-03-01T00:00:00.000+0100},
author = {Yamada, Akihiko and Wakatsuki, Nobuo and Shibano, Hideo and Itoh, Osamu and Tomita, Kyoji and Funatsu, Shigehiro},
biburl = {https://www.bibsonomy.org/bibtex/2d2ba57e772949f7f5fca6a215f273ebd/dblp},
booktitle = {DAC},
crossref = {conf/dac/1977},
editor = {Brinsfield, Judith G. and Szygenda, Stephen A. and Hightower, David W.},
ee = {http://dl.acm.org/citation.cfm?id=809108},
interhash = {a206c84d8f119582444321ec1c71fab8},
intrahash = {d2ba57e772949f7f5fca6a215f273ebd},
keywords = {dblp},
pages = {78-83},
publisher = {ACM},
timestamp = {2012-03-02T11:34:27.000+0100},
title = {Automatic test generation for large digital circuits.},
url = {http://dblp.uni-trier.de/db/conf/dac/dac1977.html#YamadaWSITF77},
year = 1977
}