%0 Conference Paper %1 conf/ats/LinWH08 %A Lin, Yi-Tsung %A Wu, Meng-Fan %A Huang, Jiun-Lang %B ATS %D 2008 %I IEEE Computer Society %K dblp %P 391-396 %T PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment. %U http://dblp.uni-trier.de/db/conf/ats/ats2008.html#LinWH08 %@ 978-0-7695-3396-4

@inproceedings{conf/ats/LinWH08, added-at = {2023-03-24T00:00:00.000+0100}, author = {Lin, Yi-Tsung and Wu, Meng-Fan and Huang, Jiun-Lang}, biburl = {https://www.bibsonomy.org/bibtex/218183d46b99c7526357664c556f2f30f/dblp}, booktitle = {ATS}, crossref = {conf/ats/2008}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2008.63}, interhash = {1a6e074f2974f300c0427172012fc88b}, intrahash = {18183d46b99c7526357664c556f2f30f}, isbn = {978-0-7695-3396-4}, keywords = {dblp}, pages = {391-396}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:37:03.000+0200}, title = {PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2008.html#LinWH08}, year = 2008 }