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Disambiguation of "Wu, Meng-Fan"

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PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment.

, , and . ATS, page 391-396. IEEE Computer Society, (2008)

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Meng Wu

Fan Wu

Fan Chen Meng

Meng-Ju Wu

Meng Meng

 

Other publications of authors with the same name

W-band OFDM RoF system with simple envelope detector down-conversion., , , and . OFC, page 1-3. IEEE, (2015)Improved weight assignment for logic switching activity during at-speed test pattern generation., , , , , and . ASP-DAC, page 493-498. IEEE, (2010)Reducing Power Supply Noise in Linear-Decompressor-Based Test Data Compression Environment for At-Speed Scan Testing., , , and . ITC, page 1-10. IEEE Computer Society, (2008)Power Supply Noise Reduction in Broadcast-Based Compression Environment for At-speed Scan Testing., , and . Asian Test Symposium, page 361-366. IEEE Computer Society, (2010)LPTest: a Flexible Low-Power Test Pattern Generator., , and . J. Electron. Test., 25 (6): 323-335 (2009)An Efficient Peak Power Reduction Technique for Scan Testing., , and . ATS, page 111-114. IEEE, (2007)Simple receiving scheme in 100-GHz DD OFDM RoF systems employing low-sampling-rate ADCs and digital preprocess., , , , , , , and . OFC, page 1-3. IEEE, (2015)A scalable quantitative measure of IR-drop effects for scan pattern generation., , , , , and . ICCAD, page 162-167. IEEE, (2010)Power Supply Noise Reduction for At-Speed Scan Testing in Linear-Decompression Environment., , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 28 (11): 1767-1776 (2009)PHS-Fill: A Low Power Supply Noise Test Pattern Generation Technique for At-Speed Scan Testing in Huffman Coding Test Compression Environment., , and . ATS, page 391-396. IEEE Computer Society, (2008)