%0 Conference Paper %1 conf/itc/HongLPMLKHNGM10 %A Hong, Ted %A Li, Yanjing %A Park, Sung-Boem %A Mui, Diana %A Lin, David %A Kaleq, Ziyad Abdel %A Hakim, Nagib %A Naeimi, Helia %A Gardner, Donald S. %A Mitra, Subhasish %B ITC %D 2010 %E Press, Ron %E Volkerink, Erik H. %I IEEE Computer Society %K dblp %P 154-163 %T QED: Quick Error Detection tests for effective post-silicon validation. %U http://dblp.uni-trier.de/db/conf/itc/itc2010.html#HongLPMLKHNGM10 %@ 978-1-4244-7206-2

@inproceedings{conf/itc/HongLPMLKHNGM10, added-at = {2023-03-23T00:00:00.000+0100}, author = {Hong, Ted and Li, Yanjing and Park, Sung-Boem and Mui, Diana and Lin, David and Kaleq, Ziyad Abdel and Hakim, Nagib and Naeimi, Helia and Gardner, Donald S. and Mitra, Subhasish}, biburl = {https://www.bibsonomy.org/bibtex/238971369bec0845b913cbd01cc9490b6/dblp}, booktitle = {ITC}, crossref = {conf/itc/2010}, editor = {Press, Ron and Volkerink, Erik H.}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.2010.5699215}, interhash = {ac3866b68bde2230ea877af364e59000}, intrahash = {38971369bec0845b913cbd01cc9490b6}, isbn = {978-1-4244-7206-2}, keywords = {dblp}, pages = {154-163}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T04:27:14.000+0200}, title = {QED: Quick Error Detection tests for effective post-silicon validation.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc2010.html#HongLPMLKHNGM10}, year = 2010 }