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QED: Quick Error Detection tests for effective post-silicon validation.

, , , , , , , , , and . ITC, page 154-163. IEEE Computer Society, (2010)

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High Voltage Tolerant Linear Regulator With Fast Digital Control for Biasing of Integrated DC-DC Converters., , , , , , and . IEEE J. Solid State Circuits, 42 (1): 66-73 (2007)Integrated inductors with magnetic materials for on-chip power conversion., , , , and . Hot Chips Symposium, page 1-36. IEEE, (2011)Bug localization techniques for effective post-silicon validation., , , and . ASP-DAC, page 291. IEEE, (2012)Overcoming Early-Life Failure and Aging for Robust Systems., , , , and . IEEE Des. Test Comput., 26 (6): 28-39 (2009)Feasibility of monolithic and 3D-stacked DC-DC converters for microprocessors in 90nm technology generation., , , , , , , and . ISLPED, page 263-268. ACM, (2004)A 233-MHz 80%-87% efficient four-phase DC-DC converter utilizing air-core inductors on package., , , , , , , , , and 1 other author(s). IEEE J. Solid State Circuits, 40 (4): 838-845 (2005)Design techniques for cross-layer resilience., , and . DATE, page 1023-1028. IEEE Computer Society, (2010)Concurrent autonomous self-test for uncore components in system-on-chips., , , and . VTS, page 232-237. IEEE Computer Society, (2010)High-frequency DC-DC conversion : fact or fiction., , , , and . ISCAS, IEEE, (2006)A Linear Regulator with Fast Digital Control for Biasing Integrated DC-DC Converters., , , , , , and . ISSCC, page 2180-2189. IEEE, (2006)