%0 Journal Article %1 journals/mr/OederCP17 %A Oeder, Thorsten %A Castellazzi, Alberto %A Pfost, Martin %D 2017 %J Microelectron. Reliab. %K dblp %P 321-326 %T Electrical and thermal failure modes of 600 V p-gate GaN HEMTs. %U http://dblp.uni-trier.de/db/journals/mr/mr76.html#OederCP17 %V 76-77

@article{journals/mr/OederCP17, added-at = {2020-06-15T00:00:00.000+0200}, author = {Oeder, Thorsten and Castellazzi, Alberto and Pfost, Martin}, biburl = {https://www.bibsonomy.org/bibtex/2979763036c380f0be45e86199f8f7d79/dblp}, ee = {https://doi.org/10.1016/j.microrel.2017.06.046}, interhash = {b002e5315f0842711f008e777c9596f3}, intrahash = {979763036c380f0be45e86199f8f7d79}, journal = {Microelectron. Reliab.}, keywords = {dblp}, pages = {321-326}, timestamp = {2020-06-16T11:59:24.000+0200}, title = {Electrical and thermal failure modes of 600 V p-gate GaN HEMTs.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr76.html#OederCP17}, volume = {76-77}, year = 2017 }