%0 Journal Article %1 journals/et/NagamaniAAA16 %A Nagamani, A. N. %A Ashwin, S. %A Abhishek, B. %A Agrawal, Vinod Kumar %D 2016 %J J. Electron. Test. %K dblp %N 2 %P 175-196 %T An Exact approach for Complete Test Set Generation of Toffoli-Fredkin-Peres based Reversible Circuits. %U http://dblp.uni-trier.de/db/journals/et/et32.html#NagamaniAAA16 %V 32

@article{journals/et/NagamaniAAA16, added-at = {2020-09-11T00:00:00.000+0200}, author = {Nagamani, A. N. and Ashwin, S. and Abhishek, B. and Agrawal, Vinod Kumar}, biburl = {https://www.bibsonomy.org/bibtex/262f435ec3d84ce004482d7883d697109/dblp}, ee = {https://doi.org/10.1007/s10836-016-5574-4}, interhash = {b0ca3ef680249ac09f1f7bde45c53e2a}, intrahash = {62f435ec3d84ce004482d7883d697109}, journal = {J. Electron. Test.}, keywords = {dblp}, number = 2, pages = {175-196}, timestamp = {2020-09-12T11:41:23.000+0200}, title = {An Exact approach for Complete Test Set Generation of Toffoli-Fredkin-Peres based Reversible Circuits.}, url = {http://dblp.uni-trier.de/db/journals/et/et32.html#NagamaniAAA16}, volume = 32, year = 2016 }