%0 Conference Paper %1 conf/essderc/LangeGLC19 %A Lange, André %A Gonzalez, Fabio A. Velarde %A Lahbib, Insaf %A Crocoll, Sonja %B ESSDERC %D 2019 %I IEEE %K dblp %P 186-189 %T Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits. %U http://dblp.uni-trier.de/db/conf/essderc/essderc2019.html#LangeGLC19 %@ 978-1-7281-1539-9

@inproceedings{conf/essderc/LangeGLC19, added-at = {2019-11-28T00:00:00.000+0100}, author = {Lange, André and Gonzalez, Fabio A. Velarde and Lahbib, Insaf and Crocoll, Sonja}, biburl = {https://www.bibsonomy.org/bibtex/2594eac7f7627f54ea959c105f3d33b7c/dblp}, booktitle = {ESSDERC}, crossref = {conf/essderc/2019}, ee = {https://doi.org/10.1109/ESSDERC.2019.8901760}, interhash = {b4a913fdefd158d6ccaa32d0075be8a8}, intrahash = {594eac7f7627f54ea959c105f3d33b7c}, isbn = {978-1-7281-1539-9}, keywords = {dblp}, pages = {186-189}, publisher = {IEEE}, timestamp = {2019-11-29T11:46:13.000+0100}, title = {Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits.}, url = {http://dblp.uni-trier.de/db/conf/essderc/essderc2019.html#LangeGLC19}, year = 2019 }