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Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits.

, , , and . ESSDERC, page 186-189. IEEE, (2019)

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Eigenschafts- und Modellbasierte Spezifikation: Ein Erfahrungsbericht., and . Grundlagen von Datenbanken, volume Bericht 94-01 of Universität Magdeburg, Forschungsbericht, page 127-131. Universität Magdeburg, (1994)Prediction of SRAM Reliability Under Mechanical Stress Induced by Harsh En§ironments., , , , , , , , , and 2 other author(s). ESSDERC, page 178-181. IEEE, (2018)Fitting standard cell performance to generalized Lambda distributions., , and . ACM Great Lakes Symposium on VLSI, page 259-264. ACM, (2011)Analysis of 28 nm SRAM cell stability under mechanical load applied by nanoindentation., , , , , , , , , and 3 other author(s). IRPS, page 5. IEEE, (2018)Hybrid dynamical systems for memristor modelling an approach avoiding the terminal-state problem., and . FDL, page 1-6. IEEE, (2013)Towards probabilistic analog behavioral modeling., , , , , and . ISCAS, page 2728-2731. IEEE, (2015)Probabilistic standard cell modeling considering non-Gaussian parameters and correlations., , , , , and . DATE, page 1-4. European Design and Automation Association, (2014)Supporting analog design for reliability by efficient provision of reliability information to designers., , , , and . DDECS, page 61-64. IEEE, (2023)Comparison of modeling approaches for transistor degradation: model card adaptations vs subcircuits., , , and . ESSDERC, page 186-189. IEEE, (2019)Multivariate Modeling of Variability Supporting Non-Gaussian and Correlated Parameters., , , , , , and . IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 35 (2): 197-210 (2016)