%0 Conference Paper %1 conf/icecsys/ParkLRKSB10 %A Park, Sangku %A Lee, Jaehoon %A Ryu, Y. %A Kang, J. %A So, B. %A Baek, Dohyun %B ICECS %D 2010 %I IEEE %K dblp %P 289-292 %T Gate oxide trap characterization under DC and pulse stress. %U http://dblp.uni-trier.de/db/conf/icecsys/icecsys2010.html#ParkLRKSB10 %@ 978-1-4244-8155-2

@inproceedings{conf/icecsys/ParkLRKSB10, added-at = {2017-05-23T00:00:00.000+0200}, author = {Park, Sangku and Lee, Jaehoon and Ryu, Y. and Kang, J. and So, B. and Baek, Dohyun}, biburl = {https://www.bibsonomy.org/bibtex/2820003355543af880e433765233a5f42/dblp}, booktitle = {ICECS}, crossref = {conf/icecsys/2010}, ee = {https://doi.org/10.1109/ICECS.2010.5724510}, interhash = {babef0bde15096215c1df26f3d57aca4}, intrahash = {820003355543af880e433765233a5f42}, isbn = {978-1-4244-8155-2}, keywords = {dblp}, pages = {289-292}, publisher = {IEEE}, timestamp = {2019-10-17T19:54:23.000+0200}, title = {Gate oxide trap characterization under DC and pulse stress.}, url = {http://dblp.uni-trier.de/db/conf/icecsys/icecsys2010.html#ParkLRKSB10}, year = 2010 }