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Gate oxide trap characterization under DC and pulse stress.

S. Park, J. Lee, Y. Ryu, J. Kang, B. So, and D. Baek. ICECS, page 289-292. IEEE, (2010)

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Ewha Kang

Mihyun Kang

Mujin Kang

Kang Teng

Andree Kang

Other publications of authors with the same name

The Physics of the B FactoriesA. Bevan, B. Golob, Th, S. Prell, B. Yabsley, K. Abe, H. Aihara, F. Anulli, N. Arnaud, T. Aushev and 2024 other author(s). The European Physical Journal C, (Jul 8, 2014)Acoustic comfort evaluation in urban open public spacesW. Yang, and J. Kang. Applied Acoustics, (2005)Codebook-based opportunistic beamforming for downlink multiple input multiple output systems.J. Kang, J. Kim, D. Kwon, and C. Lee. IET Commun., 4 (10): 1187-1195 (2010)BICEP / Keck Array XII: Constraints on axion-like polarization oscillations in the cosmic microwave backgroundK. Array, B. Collaborations, :, P. Ade, Z. Ahmed, M. Amiri, D. Barkats, R. Thakur, C. Bischoff, J. Bock and 74 other author(s). (2020)cite arxiv:2011.03483Comment: 25 pages, 6 figures, 2 tables.First demonstration of Ge waveguide platform on Ge-on-insulator for mid-infrared integrated photonics.J. Kang, M. Takenaka, and S. Takagi. ECOC, page 1-3. IEEE, (2015)A real-time encoding/decoding system (REDS) for HDTV editing.J. Jeon, Y. Park, C. Lee, J. Kang, J. Park, D. Yoon, and H. Park. MMSP, page 215-220. IEEE, (1998)BICEP / Keck XIV: Improved constraints on axion-like polarization oscillations in the cosmic microwave backgroundB. Collaboration, :, P. Ade, Z. Ahmed, M. Amiri, D. Barkats, R. Thakur, C. Bischoff, D. Beck, J. Bock and 83 other author(s). (2021)cite arxiv:2108.03316Comment: 14 pages, 3 figures.Using a Ludic Simulation to Make Learning of Middle School Space Science Fun.M. Liu, L. Horton, J. Kang, R. Kimmons, and J. Lee. Int. J. Gaming Comput. Mediat. Simulations, 5 (1): 66-86 (2013)Enhancing multimodal learning through personalized gesture recognition.M. Junokas, R. Lindgren, J. Kang, and J. Morphew. J. Comput. Assist. Learn., 34 (4): 350-357 (2018)Gate oxide trap characterization under DC and pulse stress.S. Park, J. Lee, Y. Ryu, J. Kang, B. So, and D. Baek. ICECS, page 289-292. IEEE, (2010)

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Disambiguation of "Kang, J."

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Gate oxide trap characterization under DC and pulse stress.

Please choose a person to relate this publication to

Ewha Kang

Mihyun Kang

Mujin Kang

Kang Teng

Andree Kang

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Kang, J."

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Gate oxide trap characterization under DC and pulse stress.

Please choose a person to relate this publication to

Ewha Kang

Mihyun Kang

Mujin Kang

Kang Teng

Andree Kang

Other publications of authors with the same name

Disambiguation

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DOI
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Gate oxide trap characterization under DC and pulse stress.