Please log in to take part in the discussion (add own reviews or comments).
Cite this publication
More citation styles
- please select -
%0 Conference Paper
%1 conf/ets/NeyGLPVB07
%A Ney, Alexandre
%A Girard, Patrick
%A Landrault, Christian
%A Pravossoudovitch, Serge
%A Virazel, Arnaud
%A Bastian, Magali
%B ETS
%D 2007
%I IEEE Computer Society
%K dblp
%P 97-104
%T Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs.
%U http://dblp.uni-trier.de/db/conf/ets/ets2007.html#NeyGLPVB07
%@ 978-0-7695-2827-4
@inproceedings{conf/ets/NeyGLPVB07,
added-at = {2023-03-23T00:00:00.000+0100},
author = {Ney, Alexandre and Girard, Patrick and Landrault, Christian and Pravossoudovitch, Serge and Virazel, Arnaud and Bastian, Magali},
biburl = {https://www.bibsonomy.org/bibtex/2d9a94b7e6f13399f731d61cb20b6ff01/dblp},
booktitle = {ETS},
crossref = {conf/ets/2007},
ee = {https://doi.ieeecomputersociety.org/10.1109/ETS.2007.19},
interhash = {c35348b62398417d3940b53deeae5245},
intrahash = {d9a94b7e6f13399f731d61cb20b6ff01},
isbn = {978-0-7695-2827-4},
keywords = {dblp},
pages = {97-104},
publisher = {IEEE Computer Society},
timestamp = {2024-04-10T20:47:27.000+0200},
title = {Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs.},
url = {http://dblp.uni-trier.de/db/conf/ets/ets2007.html#NeyGLPVB07},
year = 2007
}