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Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs.

A. Ney, P. Girard, C. Landrault, S. Pravossoudovitch, A. Virazel, and M. Bastian. ETS, page 97-104. IEEE Computer Society, (2007)

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Benoît Girard

Pierre Girard

Jules Girard

Adrien Girard

Yann Girard

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Prioritised ceteris paribus logic for counterfactual reasoning.P. Girard, and M. Triplett. Synthese, 195 (4): 1681-1703 (2018)Design of a Sextuple Cross-Coupled SRAM Cell with Optimized Access Operations for Highly Reliable Terrestrial Applications.A. Yan, Z. Wu, J. Zhou, Y. Hu, Y. Chen, Z. Ying, X. Wen, and P. Girard. ATS, page 55-60. IEEE, (2019)Low-energy BIST design: impact of the LFSR TPG parameters on the weighted switching activity.P. Girard, L. Guiller, C. Landrault, S. Pravossoudovitch, J. Figueras, S. Manich, J. Teixeira, and M. Santos. ISCAS (1), page 110-113. IEEE, (1999)Logical dynamics of belief change in the community.F. Liu, J. Seligman, and P. Girard. Synthese, 191 (11): 2403-2431 (2014)Effect-cause intra-cell diagnosis at transistor level.Z. Sun, A. Bosio, L. Dilillo, P. Girard, A. Todri, A. Virazel, and E. Auvray. ISQED, page 460-467. IEEE, (2013)Structural-Based Power-Aware Assignment of Don't Cares for Peak Power Reduction during Scan Testing.N. Badereddine, P. Girard, S. Pravossoudovitch, C. Landrault, A. Virazel, and H. Wunderlich. VLSI-SoC, page 403-408. IEEE, (2006)Energy Model based Control for Forming Processes.P. Girard, and V. Thomson. ICINCO-ICSO, page 51-59. INSTICC Press, (2008)Delay-Fault Diagnosis by Critical-Path Tracing.P. Girard, C. Landrault, and S. Pravossoudovitch. IEEE Des. Test Comput., 9 (4): 27-32 (1992)Towards approximation during test of Integrated Circuits.I. Wali, M. Traiola, A. Virazel, P. Girard, M. Barbareschi, and A. Bosio. DDECS, page 28-33. IEEE, (2017)From onions to broccoli: generalizing Lewis' counterfactual logic.P. Girard. J. Appl. Non Class. Logics, 17 (2): 213-229 (2007)

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Disambiguation of "Girard, Patrick"

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Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs.

Please choose a person to relate this publication to

Benoît Girard

Pierre Girard

Jules Girard

Adrien Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Girard, Patrick"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs.

Please choose a person to relate this publication to

Benoît Girard

Pierre Girard

Jules Girard

Adrien Girard

Yann Girard

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
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Dynamic Two-Cell Incorrect Read Fault Due to Resistive-Open Defects in the Sense Amplifiers of SRAMs.