%0 Conference Paper %1 conf/ats/SatoWKMK12 %A Sato, Yasuo %A Wang, Senling %A Kato, Takaaki %A Miyase, Kohei %A Kajihara, Seiji %B Asian Test Symposium %D 2012 %I IEEE Computer Society %K dblp %P 173-178 %T Low Power BIST for Scan-Shift and Capture Power. %U http://dblp.uni-trier.de/db/conf/ats/ats2012.html#SatoWKMK12 %@ 978-1-4673-4555-2

@inproceedings{conf/ats/SatoWKMK12, added-at = {2023-03-24T00:00:00.000+0100}, author = {Sato, Yasuo and Wang, Senling and Kato, Takaaki and Miyase, Kohei and Kajihara, Seiji}, biburl = {https://www.bibsonomy.org/bibtex/205a50d86f8994d3689be5b2416be5602/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2012}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2012.27}, interhash = {c7daa205b43dbc8fb0337f57a59024e8}, intrahash = {05a50d86f8994d3689be5b2416be5602}, isbn = {978-1-4673-4555-2}, keywords = {dblp}, pages = {173-178}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:33.000+0200}, title = {Low Power BIST for Scan-Shift and Capture Power.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2012.html#SatoWKMK12}, year = 2012 }