%0 Conference Paper %1 conf/itc/QuachH97 %A Quach, Minh %A Harper, Kim %B ITC %D 1997 %I IEEE Computer Society %K dblp %P 802-808 %T Real-Time In-situ Monitoring and Characterization of Production Wafer Probing Process. %U http://dblp.uni-trier.de/db/conf/itc/itc1997.html#QuachH97 %@ 0-7803-4209-7

@inproceedings{conf/itc/QuachH97, added-at = {2023-03-23T00:00:00.000+0100}, author = {Quach, Minh and Harper, Kim}, biburl = {https://www.bibsonomy.org/bibtex/26e8fb68a9dd1ef0afeed58ea89c35ee8/dblp}, booktitle = {ITC}, crossref = {conf/itc/1997}, ee = {https://doi.ieeecomputersociety.org/10.1109/TEST.1997.639694}, interhash = {cc415a0aa6115570f53caf5967cfd0b3}, intrahash = {6e8fb68a9dd1ef0afeed58ea89c35ee8}, isbn = {0-7803-4209-7}, keywords = {dblp}, pages = {802-808}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T19:53:11.000+0200}, title = {Real-Time In-situ Monitoring and Characterization of Production Wafer Probing Process.}, url = {http://dblp.uni-trier.de/db/conf/itc/itc1997.html#QuachH97}, year = 1997 }