%0 Conference Paper %1 conf/ats/MaedaMP17 %A Maeda, Yoichi %A Matsushima, Jun %A Press, Ron %B ATS %D 2017 %I IEEE Computer Society %K dblp %P 237-241 %T Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test. %U http://dblp.uni-trier.de/db/conf/ats/ats2017.html#MaedaMP17 %@ 978-1-5386-2437-1

@inproceedings{conf/ats/MaedaMP17, added-at = {2023-03-24T00:00:00.000+0100}, author = {Maeda, Yoichi and Matsushima, Jun and Press, Ron}, biburl = {https://www.bibsonomy.org/bibtex/2857ffa5085641e92bcaa6b521cf69d3c/dblp}, booktitle = {ATS}, crossref = {conf/ats/2017}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2017.52}, interhash = {ccc446642fc167ca1a1e1e19dab12b1c}, intrahash = {857ffa5085641e92bcaa6b521cf69d3c}, isbn = {978-1-5386-2437-1}, keywords = {dblp}, pages = {237-241}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:36.000+0200}, title = {Automotive IC On-line Test Techniques and the Application of Deterministic ATPG-Based Runtime Test.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2017.html#MaedaMP17}, year = 2017 }