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%0 Journal Article
%1 journals/mr/CortesRFUHR05
%A Cortés, Ignasi
%A Roig, Jaume
%A Flores, David
%A Urresti, Jesús
%A Hidalgo, Salvador
%A Rebollo, José
%D 2005
%J Microelectron. Reliab.
%K dblp
%N 3-4
%P 493-498
%T Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile.
%U http://dblp.uni-trier.de/db/journals/mr/mr45.html#CortesRFUHR05
%V 45
@article{journals/mr/CortesRFUHR05,
added-at = {2021-10-14T00:00:00.000+0200},
author = {Cortés, Ignasi and Roig, Jaume and Flores, David and Urresti, Jesús and Hidalgo, Salvador and Rebollo, José},
biburl = {https://www.bibsonomy.org/bibtex/228c0bf6971e560e28f33cd743d255b66/dblp},
ee = {https://doi.org/10.1016/j.microrel.2004.08.005},
interhash = {d0d0c519ff907e4058ee32074e1e2d54},
intrahash = {28c0bf6971e560e28f33cd743d255b66},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {3-4},
pages = {493-498},
timestamp = {2024-04-09T02:49:28.000+0200},
title = {Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#CortesRFUHR05},
volume = 45,
year = 2005
}