%0 Journal Article %1 journals/mr/CortesRFUHR05 %A Cortés, Ignasi %A Roig, Jaume %A Flores, David %A Urresti, Jesús %A Hidalgo, Salvador %A Rebollo, José %D 2005 %J Microelectron. Reliab. %K dblp %N 3-4 %P 493-498 %T Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile. %U http://dblp.uni-trier.de/db/journals/mr/mr45.html#CortesRFUHR05 %V 45

@article{journals/mr/CortesRFUHR05, added-at = {2021-10-14T00:00:00.000+0200}, author = {Cortés, Ignasi and Roig, Jaume and Flores, David and Urresti, Jesús and Hidalgo, Salvador and Rebollo, José}, biburl = {https://www.bibsonomy.org/bibtex/228c0bf6971e560e28f33cd743d255b66/dblp}, ee = {https://doi.org/10.1016/j.microrel.2004.08.005}, interhash = {d0d0c519ff907e4058ee32074e1e2d54}, intrahash = {28c0bf6971e560e28f33cd743d255b66}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {3-4}, pages = {493-498}, timestamp = {2024-04-09T02:49:28.000+0200}, title = {Analysis of hot-carrier degradation in a SOI LDMOS transistor with a steep retrograde drift doping profile.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr45.html#CortesRFUHR05}, volume = 45, year = 2005 }