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- BibTeX key
- conf/esscirc/SonKAHMPHJCJK10
- entry type
- inproceedings
- booktitle
- ESSCIRC
- year
- 2010
- pages
- 482-485
- publisher
- IEEE
- crossref
- conf/esscirc/2010
- ee
- https://doi.org/10.1109/ESSCIRC.2010.5619748
- isbn
- 978-1-4244-6662-7
- url
- http://dblp.uni-trier.de/db/conf/esscirc/esscirc2010.html#SonKAHMPHJCJK10
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- please select -%0 Conference Paper
%1 conf/esscirc/SonKAHMPHJCJK10
%A Son, Jong-Pil
%A Kim, Jin Ho
%A Ahn, Woo Song
%A Han, Seung Uk
%A Moon, Byung-Sick
%A Park, Churoo
%A Hwang, Hong-Sun
%A Jang, Seong-Jin
%A Choi, Joo-Sun
%A Jun, Young-Hyun
%A Kim, Soo-Won
%B ESSCIRC
%D 2010
%I IEEE
%K dblp
%P 482-485
%T A highly reliable multi-cell antifuse scheme using DRAM cell capacitors.
%U http://dblp.uni-trier.de/db/conf/esscirc/esscirc2010.html#SonKAHMPHJCJK10
%@ 978-1-4244-6662-7
@inproceedings{conf/esscirc/SonKAHMPHJCJK10,
added-at = {2020-04-27T00:00:00.000+0200},
author = {Son, Jong-Pil and Kim, Jin Ho and Ahn, Woo Song and Han, Seung Uk and Moon, Byung-Sick and Park, Churoo and Hwang, Hong-Sun and Jang, Seong-Jin and Choi, Joo-Sun and Jun, Young-Hyun and Kim, Soo-Won},
biburl = {https://www.bibsonomy.org/bibtex/28dc703b78ff5f2e9362b5fc9bf83c116/dblp},
booktitle = {ESSCIRC},
crossref = {conf/esscirc/2010},
ee = {https://doi.org/10.1109/ESSCIRC.2010.5619748},
interhash = {ec61d8a236925b87bf4e4ff508939635},
intrahash = {8dc703b78ff5f2e9362b5fc9bf83c116},
isbn = {978-1-4244-6662-7},
keywords = {dblp},
pages = {482-485},
publisher = {IEEE},
timestamp = {2024-04-09T17:25:26.000+0200},
title = {A highly reliable multi-cell antifuse scheme using DRAM cell capacitors.},
url = {http://dblp.uni-trier.de/db/conf/esscirc/esscirc2010.html#SonKAHMPHJCJK10},
year = 2010
}