%0 Conference Paper %1 conf/dft/TsoumanisPES21 %A Tsoumanis, Pelopidas %A Paliaroutis, Georgios Ioannis %A Evmorfopoulos, Nestoras E. %A Stamoulis, George I. %B DFT %D 2021 %E Dilillo, Luigi %E Cassano, Luca %E Papadimitriou, Athanasios %I IEEE %K dblp %P 1-6 %T On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate Estimation in Deep Submicron Technologies. %U http://dblp.uni-trier.de/db/conf/dft/dft2021.html#TsoumanisPES21 %@ 978-1-6654-1609-2

@inproceedings{conf/dft/TsoumanisPES21, added-at = {2021-10-22T00:00:00.000+0200}, author = {Tsoumanis, Pelopidas and Paliaroutis, Georgios Ioannis and Evmorfopoulos, Nestoras E. and Stamoulis, George I.}, biburl = {https://www.bibsonomy.org/bibtex/207fbc9cb6f1e12b0b897988ca44e7390/dblp}, booktitle = {DFT}, crossref = {conf/dft/2021}, editor = {Dilillo, Luigi and Cassano, Luca and Papadimitriou, Athanasios}, ee = {https://doi.org/10.1109/DFT52944.2021.9568306}, interhash = {ee4d6210b20b4bb9da464ab2d54c2869}, intrahash = {07fbc9cb6f1e12b0b897988ca44e7390}, isbn = {978-1-6654-1609-2}, keywords = {dblp}, pages = {1-6}, publisher = {IEEE}, timestamp = {2024-04-09T23:07:59.000+0200}, title = {On the Impact of Electrical Masking and Timing Analysis on Soft Error Rate Estimation in Deep Submicron Technologies.}, url = {http://dblp.uni-trier.de/db/conf/dft/dft2021.html#TsoumanisPES21}, year = 2021 }