%0 Conference Paper %1 conf/glvlsi/LamWJDW14 %A Lam, Tak-Kei %A Wei, Xing %A Jone, Wen-Ben %A Diao, Yi %A Wu, Yu-Liang %B ACM Great Lakes Symposium on VLSI %D 2014 %E Cavallaro, Joseph R. %E Zhang, Tong %E Jones, Alex K. %E Li, Hai (Helen) %I ACM %K dblp %P 233-234 %T On macro-fault: a new fault model, its implications on fault tolerance and manufacturing yield. %U http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi2014.html#LamWJDW14 %@ 978-1-4503-2816-6

@inproceedings{conf/glvlsi/LamWJDW14, added-at = {2018-11-06T00:00:00.000+0100}, author = {Lam, Tak-Kei and Wei, Xing and Jone, Wen-Ben and Diao, Yi and Wu, Yu-Liang}, biburl = {https://www.bibsonomy.org/bibtex/2c8f65c528cfdf8743a7476ecd0cbf1f7/dblp}, booktitle = {ACM Great Lakes Symposium on VLSI}, crossref = {conf/glvlsi/2014}, editor = {Cavallaro, Joseph R. and Zhang, Tong and Jones, Alex K. and Li, Hai (Helen)}, ee = {https://doi.org/10.1145/2591513.2591556}, interhash = {f184d43f09fa057106cdbbb10a4a5ae0}, intrahash = {c8f65c528cfdf8743a7476ecd0cbf1f7}, isbn = {978-1-4503-2816-6}, keywords = {dblp}, pages = {233-234}, publisher = {ACM}, timestamp = {2018-11-07T14:25:01.000+0100}, title = {On macro-fault: a new fault model, its implications on fault tolerance and manufacturing yield.}, url = {http://dblp.uni-trier.de/db/conf/glvlsi/glvlsi2014.html#LamWJDW14}, year = 2014 }