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%0 Journal Article
%1 journals/mr/Kuper08
%A Kuper, Fred G.
%D 2008
%J Microelectron. Reliab.
%K dblp
%N 8-9
%P 1459-1463
%T Automotive IC reliability: Elements of the battle towards zero defects.
%U http://dblp.uni-trier.de/db/journals/mr/mr48.html#Kuper08
%V 48
@article{journals/mr/Kuper08,
added-at = {2020-02-22T00:00:00.000+0100},
author = {Kuper, Fred G.},
biburl = {https://www.bibsonomy.org/bibtex/2aab308f699432cc0c2275d2ec861b918/dblp},
ee = {https://doi.org/10.1016/j.microrel.2008.06.026},
interhash = {fb97a8e545d47c1b89ae1f8928ec687b},
intrahash = {aab308f699432cc0c2275d2ec861b918},
journal = {Microelectron. Reliab.},
keywords = {dblp},
number = {8-9},
pages = {1459-1463},
timestamp = {2020-02-25T13:27:10.000+0100},
title = {Automotive IC reliability: Elements of the battle towards zero defects.},
url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#Kuper08},
volume = 48,
year = 2008
}