%0 Journal Article %1 journals/mr/Kuper08 %A Kuper, Fred G. %D 2008 %J Microelectron. Reliab. %K dblp %N 8-9 %P 1459-1463 %T Automotive IC reliability: Elements of the battle towards zero defects. %U http://dblp.uni-trier.de/db/journals/mr/mr48.html#Kuper08 %V 48

@article{journals/mr/Kuper08, added-at = {2020-02-22T00:00:00.000+0100}, author = {Kuper, Fred G.}, biburl = {https://www.bibsonomy.org/bibtex/2aab308f699432cc0c2275d2ec861b918/dblp}, ee = {https://doi.org/10.1016/j.microrel.2008.06.026}, interhash = {fb97a8e545d47c1b89ae1f8928ec687b}, intrahash = {aab308f699432cc0c2275d2ec861b918}, journal = {Microelectron. Reliab.}, keywords = {dblp}, number = {8-9}, pages = {1459-1463}, timestamp = {2020-02-25T13:27:10.000+0100}, title = {Automotive IC reliability: Elements of the battle towards zero defects.}, url = {http://dblp.uni-trier.de/db/journals/mr/mr48.html#Kuper08}, volume = 48, year = 2008 }