%0 Conference Paper %1 journals/procedia/CanalRABMZGV11 %A Canal, Ramon %A Rubio, Antonio %A Asenov, A. %A Brown, A. %A Miranda, Miguel %A Zuber, Paul %A González, Antonio %A Vera, Xavier %B FET %D 2011 %E Giacobino, Elisabeth %E Pfeifer, Rolf %I Elsevier %K dblp %P 148-149 %T TRAMS Project: Variability and Reliability of SRAM Memories in sub-22 nm Bulk-CMOS Technologies. %U http://dblp.uni-trier.de/db/journals/procedia/procedia7.html#CanalRABMZGV11 %V 7

@inproceedings{journals/procedia/CanalRABMZGV11, added-at = {2023-07-06T00:00:00.000+0200}, author = {Canal, Ramon and Rubio, Antonio and Asenov, A. and Brown, A. and Miranda, Miguel and Zuber, Paul and González, Antonio and Vera, Xavier}, biburl = {https://www.bibsonomy.org/bibtex/20b0f9345e2fe11f1331daf7cc8a7eb8c/dblp}, booktitle = {FET}, crossref = {conf/fet/2011}, editor = {Giacobino, Elisabeth and Pfeifer, Rolf}, ee = {https://doi.org/10.1016/j.procs.2011.09.010}, interhash = {d433d01937e7e4d06430ccc55dd22d97}, intrahash = {0b0f9345e2fe11f1331daf7cc8a7eb8c}, keywords = {dblp}, pages = {148-149}, publisher = {Elsevier}, series = {Procedia Computer Science}, timestamp = {2024-04-09T21:11:44.000+0200}, title = {TRAMS Project: Variability and Reliability of SRAM Memories in sub-22 nm Bulk-CMOS Technologies.}, url = {http://dblp.uni-trier.de/db/journals/procedia/procedia7.html#CanalRABMZGV11}, volume = 7, year = 2011 }