%0 Conference Paper %1 Henard.2013 %A Henard, Christopher %A Papadakis, Mike %A Perrouin, Gilles %A Klein, Jacques %A Le Traon, Yves %B ICSTW '13: IEEE 6th International Conference On Software Testing, Verification and Validation Workshops 2013 %D 2013 %K Informatik %P 188–197 %T Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing

@inproceedings{Henard.2013, added-at = {2013-10-18T15:40:43.000+0200}, author = {Henard, Christopher and Papadakis, Mike and Perrouin, Gilles and Klein, Jacques and Le Traon, Yves}, biburl = {https://www.bibsonomy.org/bibtex/2223a2ad9dd9412600f28a847460e80a5/hlackner}, booktitle = {ICSTW '13: IEEE 6th International Conference On Software Testing, Verification and Validation Workshops 2013}, interhash = {cd85181a38d156f3020a0f9787ce8bc1}, intrahash = {223a2ad9dd9412600f28a847460e80a5}, keywords = {Informatik}, pages = {188–197}, timestamp = {2013-10-18T15:40:43.000+0200}, title = {Assessing Software Product Line Testing Via Model-Based Mutation: An Application to Similarity Testing}, year = 2013 }