%0 Conference Paper %1 conf/ats/InuyamaAI16 %A Inuyama, Shingo %A Arai, Masayuki %A Iwasaki, Kazuhiko %B ATS %D 2016 %I IEEE Computer Society %K dblp %P 191-196 %T Critical-Area-Aware Test Pattern Generation and Reordering. %U http://dblp.uni-trier.de/db/conf/ats/ats2016.html#InuyamaAI16 %@ 978-1-5090-3809-1

@inproceedings{conf/ats/InuyamaAI16, added-at = {2023-03-24T00:00:00.000+0100}, author = {Inuyama, Shingo and Arai, Masayuki and Iwasaki, Kazuhiko}, biburl = {https://www.bibsonomy.org/bibtex/2255534ab1965f3fd7843d355f38c4078/dblp}, booktitle = {ATS}, crossref = {conf/ats/2016}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2016.48}, interhash = {34b420eeee39703b41c68a61738da94b}, intrahash = {255534ab1965f3fd7843d355f38c4078}, isbn = {978-1-5090-3809-1}, keywords = {dblp}, pages = {191-196}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:46.000+0200}, title = {Critical-Area-Aware Test Pattern Generation and Reordering.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2016.html#InuyamaAI16}, year = 2016 }