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Critical-Area-Aware Test Pattern Generation and Reordering.

, , and . ATS, page 191-196. IEEE Computer Society, (2016)

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Layout-aware 2-step window-based pattern reordering for fast bridge/open test generation., , and . ITC, page 1-8. IEEE, (2017)Critical-Area-Aware Test Pattern Generation and Reordering., , and . ATS, page 191-196. IEEE Computer Society, (2016)Note on Fast Bridge Fault Test Generation Based on Critical Area., , and . ICA3PP (3), volume 9530 of Lecture Notes in Computer Science, page 729-740. Springer, (2015)Layout-Aware Fast Bridge/Open Test Generation by 2-Step Pattern Reordering., , and . IEICE Trans. Fundam. Electron. Commun. Comput. Sci., 101-A (12): 2262-2270 (2018)