%0 Journal Article %1 journals/access/InabaOAFIKSFM24 %A Inaba, Takumi %A Oka, Hiroshi %A Asai, Hidehiro %A Fuketa, Hiroshi %A Iizuka, Shota %A Kato, Kimihiko %A Shitakata, Shunsuke %A Fukuda, Koichi %A Mori, Takahiro %D 2024 %J IEEE Access %K dblp %P 12458-12464 %T Temperature Dependent Variations of Low-Frequency Noise Sources in Cryogenic Short-Channel Bulk MOSFETs. %U http://dblp.uni-trier.de/db/journals/access/access12.html#InabaOAFIKSFM24 %V 12

@article{journals/access/InabaOAFIKSFM24, added-at = {2024-02-05T00:00:00.000+0100}, author = {Inaba, Takumi and Oka, Hiroshi and Asai, Hidehiro and Fuketa, Hiroshi and Iizuka, Shota and Kato, Kimihiko and Shitakata, Shunsuke and Fukuda, Koichi and Mori, Takahiro}, biburl = {https://www.bibsonomy.org/bibtex/2274c27ef4199e96e12f5daf13339e7de/dblp}, ee = {https://doi.org/10.1109/ACCESS.2024.3355588}, interhash = {edd6551a050a7983f334fdaba93b0aeb}, intrahash = {274c27ef4199e96e12f5daf13339e7de}, journal = {IEEE Access}, keywords = {dblp}, pages = {12458-12464}, timestamp = {2024-04-08T14:15:17.000+0200}, title = {Temperature Dependent Variations of Low-Frequency Noise Sources in Cryogenic Short-Channel Bulk MOSFETs.}, url = {http://dblp.uni-trier.de/db/journals/access/access12.html#InabaOAFIKSFM24}, volume = 12, year = 2024 }