Author of the publication

Temperature Dependent Variations of Low-Frequency Noise Sources in Cryogenic Short-Channel Bulk MOSFETs.

, , , , , , , , and . IEEE Access, (2024)

Please choose a person to relate this publication to

To differ between persons with the same name, the academic degree and the title of an important publication will be displayed. You can also use the button next to the name to display some publications already assigned to the person.

 

Other publications of authors with the same name

Advanced MOS Device Technology for Low Power Logic LSI., , , , , , , , , and . MIXDES, page 26-33. IEEE, (2019)MOS Device Technology using Alternative Channel Materials for Low Power Logic LSI., , , , , , , , and . ESSDERC, page 6-11. IEEE, (2018)Single-Electron Transistor Operation of a Physically Defined Silicon Quantum Dot Device Fabricated by Electron Beam Lithography Employing a Negative-Tone Resist., , , , , , and . IEICE Trans. Electron., 106 (10): 592-596 (October 2023)Fabrication of High Quality InAs-on-Lnsulator Structures by Smart Cut Process with Reuse of InAs Wafers., , , , , and . 3DIC, page 1-2. IEEE, (2019)Determining the low-frequency noise source in cryogenic operation of short-channel bulk MOSFETs., , , , , , , , and . VLSI Technology and Circuits, page 1-2. IEEE, (2023)Effect of Conduction Band Edge States on Coulomb-Limiting Electron Mobility in Cryogenic MOSFET Operation., , , , , and . VLSI Technology and Circuits, page 334-335. IEEE, (2022)Origin of Low-Frequency Noise in Si n-MOSFET at Cryogenic Temperatures: The Effect of Interface Quality., , , , , , , and . IEEE Access, (2023)Temperature Dependent Variations of Low-Frequency Noise Sources in Cryogenic Short-Channel Bulk MOSFETs., , , , , , , , and . IEEE Access, (2024)Buried nanomagnet realizing high-speed/low-variability silicon spin qubits: implementable in error-correctable large-scale quantum computers., , , , , , , , , and . VLSI Circuits, page 1-2. IEEE, (2021)