%0 Journal Article %1 Parrish1995 %A Parrish, Allen S. %A Zweben, Stuart H. %D 1995 %J IEEE Trans. Software Eng. %K Criteria adequacy control coverage data defs-uses flow testing %N 12 %P 1006-1009 %T On the Relationships Among the All-Uses, All-DU-Paths, and All-Edges Testing Criteria %V 21

@article{Parrish1995, added-at = {2008-07-30T14:13:46.000+0200}, author = {Parrish, Allen S. and Zweben, Stuart H.}, bibsource = {DBLP, http://dblp.uni-trier.de}, biburl = {https://www.bibsonomy.org/bibtex/23637f91edf3d7365c52e2600805f8305/ist_spl}, ee = {http://www.computer.org/tse/ts1995/e1006abs.htm}, interhash = {fb85f691cc2d90c3434f0a7ceb8d6de2}, intrahash = {3637f91edf3d7365c52e2600805f8305}, journal = {IEEE Trans. Software Eng.}, keywords = {Criteria adequacy control coverage data defs-uses flow testing}, number = 12, pages = {1006-1009}, timestamp = {2008-07-30T14:13:46.000+0200}, title = {On the Relationships Among the All-Uses, All-DU-Paths, and All-Edges Testing Criteria}, volume = 21, year = 1995 }