%0 Journal Article %1 journals/tvlsi/ChunKIK06 %A Chun, Sunghoon %A Kim, YongJoon %A Im, Jung-Been %A Kang, Sungho %D 2006 %J IEEE Trans. Very Large Scale Integr. Syst. %K dblp %N 6 %P 649-654 %T MICRO: a new hybrid test data compression/decompression scheme. %U http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi14.html#ChunKIK06 %V 14

@article{journals/tvlsi/ChunKIK06, added-at = {2024-02-27T00:00:00.000+0100}, author = {Chun, Sunghoon and Kim, YongJoon and Im, Jung-Been and Kang, Sungho}, biburl = {https://www.bibsonomy.org/bibtex/238aedd080b5dfd3fde98c8b233b919f7/dblp}, ee = {https://doi.org/10.1109/TVLSI.2006.878227}, interhash = {9f6b4a71dd5da76d95830a2696042117}, intrahash = {38aedd080b5dfd3fde98c8b233b919f7}, journal = {IEEE Trans. Very Large Scale Integr. Syst.}, keywords = {dblp}, number = 6, pages = {649-654}, timestamp = {2024-04-08T14:31:39.000+0200}, title = {MICRO: a new hybrid test data compression/decompression scheme.}, url = {http://dblp.uni-trier.de/db/journals/tvlsi/tvlsi14.html#ChunKIK06}, volume = 14, year = 2006 }