%0 Conference Paper %1 conf/ets/JungAKYP15 %A Jung, Jihun %A Ansari, Muhammad Adil %A Kim, Dooyoung %A Yi, Hyunbean %A Park, Sungju %B ETS %D 2015 %I IEEE %K dblp %P 1-2 %T Efficient diagnosis technique for aging defects on automotive semiconductor chips. %U http://dblp.uni-trier.de/db/conf/ets/ets2015.html#JungAKYP15 %@ 978-1-4799-7603-4

@inproceedings{conf/ets/JungAKYP15, added-at = {2017-05-22T00:00:00.000+0200}, author = {Jung, Jihun and Ansari, Muhammad Adil and Kim, Dooyoung and Yi, Hyunbean and Park, Sungju}, biburl = {https://www.bibsonomy.org/bibtex/25202b47f86c0acd0c97dc32ef6e16362/dblp}, booktitle = {ETS}, crossref = {conf/ets/2015}, ee = {https://doi.org/10.1109/ETS.2015.7138767}, interhash = {e509bfefc6041141392d18e83b13ff7c}, intrahash = {5202b47f86c0acd0c97dc32ef6e16362}, isbn = {978-1-4799-7603-4}, keywords = {dblp}, pages = {1-2}, publisher = {IEEE}, timestamp = {2019-10-17T15:59:26.000+0200}, title = {Efficient diagnosis technique for aging defects on automotive semiconductor chips.}, url = {http://dblp.uni-trier.de/db/conf/ets/ets2015.html#JungAKYP15}, year = 2015 }