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Efficient diagnosis technique for aging defects on automotive semiconductor chips.

J. Jung, M. Ansari, D. Kim, H. Yi, and S. Park. ETS, page 1-2. IEEE, (2015)

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Rosemary Park

Sungjune Park

Eunhong Park

Younggyu Park

Hyeyoung Park

Other publications of authors with the same name

The educational use of home robots for children.J. Han, M. Jo, S. Park, and S. Kim. RO-MAN, page 378-383. IEEE, (2005)Efficient Interconnect Test Patterns for Crosstalk and Static Faults.P. Min, H. Yi, J. Song, S. Baeg, and S. Park. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 25 (11): 2605-2608 (2006)On Diagnosing the Aging Level of Automotive Semiconductor Devices.J. Jung, M. Ansari, D. Kim, H. Yi, and S. Park. IEEE Trans. Circuits Syst. II Express Briefs, 64-II (7): 822-826 (2017)An Efficient SoC Test Technique by Reusing On/Off-Chip Bus Bridge.J. Song, H. Yi, J. Han, and S. Park. IEEE Trans. Circuits Syst. I Regul. Pap., 56-I (3): 554-565 (2009)Reliable Test Architecture With Test Cost Reduction for Systolic-Based DNN Accelerators.M. Ibtesam, U. Solangi, J. Kim, M. Ansari, and S. Park. IEEE Trans. Circuits Syst. II Express Briefs, 69 (3): 1537-1541 (2022)Highly Efficient Test Architecture for Low-Power AI Accelerators.M. Ibtesam, U. Solangi, J. Kim, M. Ansari, and S. Park. IEEE Trans. Comput. Aided Des. Integr. Circuits Syst., 41 (8): 2728-2738 (2022)Design of Test Access Mechanism for AMBA-Based System-on-a-Chip.J. Song, P. Min, H. Yi, and S. Park. VTS, page 375-380. IEEE Computer Society, (2007)Why is less information from logic simulation more useful in fault simulation?S. Jr., S. Park, B. Krishnamurthy, and A. Swaminathan. ITC, page 786-800. IEEE Computer Society, (1990)Interconnect Delay Fault Test on Boards and SoCs with Multiple Clock Domains.H. Yi, J. Song, and S. Park. ITC, page 1-7. IEEE Computer Society, (2006)An Efficient Secure Scan Design for an SoC Embedding AES Core.J. Song, T. Jung, J. Lee, H. Jeong, B. Kim, and S. Park. ITC, page 1. IEEE Computer Society, (2008)

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Disambiguation of "Park, Sungju"

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Efficient diagnosis technique for aging defects on automotive semiconductor chips.

Please choose a person to relate this publication to

Rosemary Park

Sungjune Park

Eunhong Park

Younggyu Park

Hyeyoung Park

Other publications of authors with the same name

Disambiguation

BibSonomy

Disambiguation of "Park, Sungju"

copydeleteadd this publication to your clipboardcommunity posthistory of this postURLDOIBibTeXEndNoteAPAChicagoDIN 1505HarvardMSOffice XML Efficient diagnosis technique for aging defects on automotive semiconductor chips.

Please choose a person to relate this publication to

Rosemary Park

Sungjune Park

Eunhong Park

Younggyu Park

Hyeyoung Park

Other publications of authors with the same name

Disambiguation

copy delete add this publication to your clipboard
community post
history of this post
URL
DOI
BibTeX
EndNote
APA
Chicago
DIN 1505
Harvard
MSOffice XML

Efficient diagnosis technique for aging defects on automotive semiconductor chips.