%0 Conference Paper %1 conf/ats/ShengK10 %A Sheng, Xiaoqin %A Kerkhoff, Hans G. %B Asian Test Symposium %D 2010 %I IEEE Computer Society %K dblp %P 289-294 %T The Test Ability of an Adaptive Pulse Wave for ADC Testing. %U http://dblp.uni-trier.de/db/conf/ats/ats2010.html#ShengK10 %@ 978-0-7695-4248-5

@inproceedings{conf/ats/ShengK10, added-at = {2023-03-24T00:00:00.000+0100}, author = {Sheng, Xiaoqin and Kerkhoff, Hans G.}, biburl = {https://www.bibsonomy.org/bibtex/2791b931088fb22846acc56adf1cd27ab/dblp}, booktitle = {Asian Test Symposium}, crossref = {conf/ats/2010}, ee = {https://doi.ieeecomputersociety.org/10.1109/ATS.2010.56}, interhash = {53df796b6efbac257ca5e3cdd384d7a3}, intrahash = {791b931088fb22846acc56adf1cd27ab}, isbn = {978-0-7695-4248-5}, keywords = {dblp}, pages = {289-294}, publisher = {IEEE Computer Society}, timestamp = {2024-04-10T06:36:56.000+0200}, title = {The Test Ability of an Adaptive Pulse Wave for ADC Testing.}, url = {http://dblp.uni-trier.de/db/conf/ats/ats2010.html#ShengK10}, year = 2010 }