%0 Journal Article %1 journals/tcad/KonukFL96 %A Konuk, Haluk %A Ferguson, F. Joel %A Larrabee, Tracy %D 1996 %J IEEE Trans. Comput. Aided Des. Integr. Circuits Syst. %K dblp %N 12 %P 1555-1567 %T Charge-based fault simulation for CMOS network breaks. %U http://dblp.uni-trier.de/db/journals/tcad/tcad15.html#KonukFL96 %V 15

@article{journals/tcad/KonukFL96, added-at = {2020-09-24T00:00:00.000+0200}, author = {Konuk, Haluk and Ferguson, F. Joel and Larrabee, Tracy}, biburl = {https://www.bibsonomy.org/bibtex/285aa41e5bb892c6e65831d7a2e25d420/dblp}, ee = {https://doi.org/10.1109/43.552089}, interhash = {104c8ba999b8a77829aba3348d0070e9}, intrahash = {85aa41e5bb892c6e65831d7a2e25d420}, journal = {IEEE Trans. Comput. Aided Des. Integr. Circuits Syst.}, keywords = {dblp}, number = 12, pages = {1555-1567}, timestamp = {2020-09-25T11:49:34.000+0200}, title = {Charge-based fault simulation for CMOS network breaks.}, url = {http://dblp.uni-trier.de/db/journals/tcad/tcad15.html#KonukFL96}, volume = 15, year = 1996 }